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● Product name:8″ PEI Wafer Cassette
● Part number:PE-C200
● Dimension:234.5(L) x 202.31 (W) x 2 17.8 5(H)mm
● Weight:932.5g
● Capacity:25 PCS
● Apply for round wafer:8 inch (Ø200mm) Wafer
● Material:PEI ESD
● Slot Pitch:6.35mm
● Degree of temperature resistance:120°C
● Product name:8″ Wafer Cassette
● Part number:PP-C200
● Dimension: 235(L) x 214(W) x 219(H)mm
● Weight:900g
● Capacity:25 PCS
● Apply for round wafer:8 inch (Ø200mm) Wafer
● Material:ESD Resin
● Slot Pitch:6.35mm
● Product name:12″ Horizontal Wafer Shippers / Wafer Stack Box
● Part number:HW-S300
● Dimension:343(L) x 343(W) x 110.5 (H)mm
● Weight:1400g
● Capacity:25 PCS
● Apply for round wafer:12 inch (Ø300mm)
● Material:PP ESD
● Product name:FOUP Adapter
● Part number:AD-F200
● Dimension:440(L) x 347(W) x 337(H)mm
● Capacity:13 PCS
● Apply for round wafer:8 inch (Ø200mm) Wafer
● Material:PC ESD
Entrepix provides parts, upgrades, service, and refurbishment services and refurbished tools for the Applied Materials Reflexion® 3600, Reflexion LK 3800, Reflexion LK Prime®, and Reflexion LK Prime® S integrated CMP tools.
Customization Made Easy
Whether for incoming and outgoing inspection, quality control in the production process: safety and reliability are always the focus of our modular belt sorter systems. The modules enable specific sorting and measurements with our well proven MX systems, belt transport, receiving stations with wafer switches and much more. More than 35 years of development ensure smooth integration into your production chain – exactly as your process requires.
● Product name:Custom Mask Cassette
● Capacity:15 PCS
● Mask size:5 inch / 8 inch
● Material:PTFE
Entrepix’ next-generation head tester puts the data in your hands to achieve less downtime and significant cost savings.
Entrepix designed this innovative, customer-favorite head tester through years of testing and troubleshooting. Now the head testing step transforms from a simple verification tool in the legacy version into a powerful troubleshooting platform. The new Entrepix head tester provides powerful troubleshooting capability that helps users dial in sensitive CMP processes while tracking each head via serial number. Our tester simulates wafer de-chuck and automatically checks the wafer present/absent sensor function, all while tracking test data for statistical process control.
Available in 6 zone for Titan I, Titan II (Profiler), and Contour polish heads
Available in 8 zone for Titan I, Titan II (Profiler), Contour and EVO polish heads.
Entrepix’ head tester allows real-time monitoring of “cross-talk” between head chambers and allows users to interrupt testing for faster chamber troubleshooting.
Entrepix offers upgrades, refurbishments, and spare parts for your IPEC 472 platforms.