FILCON® SR Mini Mini Spectroscopic Reflectometer

Cost-effective all-in-one SR measurement equipment for research and development ·
of  thickness, reflectance and transmittance of thin films

Measure the measurement area while watching the live camera image.
Nano-level thin film thickness measurement and image XY dimension measurement are possible.
Provides powerful measurement function in a compact equipment configuration.
Simple and  easy Windows GUI measurement program